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400nm - 1100nm Wavelength Laser Instrument M2 Meter / M2 Factor Measurement System

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Wuhan Sintec Optronics Co., Ltd,
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400nm - 1100nm Wavelength Laser Instrument M2 Meter / M2 Factor Measurement System

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Brand Name :Sintec Optronics
Delivery Time :Stock
Payment Terms :T/T via bank
Model Number :STC Series
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Wavelength 400-1100nm M² Meter / M² Factor Measurement System

Laser beam quality and its focusing capability are very important parameters of a laser and are usually characterized by M² factor. To measure the M² factor for a laser, it is calculated based on the difference between the product of the beam diameter and divergence, and the ideal Gaussian beam diffraction limit. The laser beam quality M2 is as below:

M2=(PI/4*LAMDA)*d0*THETA)

Where M2 is the laser beam quality M2, PI is 3.1415927, LAMDA is laser wavelength, d 0 is beam diameter, and THETA is divergence angle.

Part number STC-M2
Detector material Si
Wavelength range 400-1100nm
Receiving beam diameter 20um-9mm
Testing output power range 10nW-10W(Depends on the beam diameter)

The system comes with software. After the positions are keyed in the software, the beam diameters, beam divergence angle, and M2 will be calculated and given as shown as follows:

400nm - 1100nm Wavelength Laser Instrument M2 Meter / M2 Factor Measurement System

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